June 5th, 2022


June 8th, 2022

Register for In-Person
Virtual Only

ON-DEMAND Access 24/7 from

June 9th, 2022 – July 9th, 2022


SWTest moves to our new home at the Omni Resorts La Costa in Carlsbad, CA, a self-contained 400-acre alfresco campus environment with coastal breezes and a garden paradise overflowing with lush landscaping. The Omni Resorts features two ballrooms: The 18,000 sq. ft. Costa Del Sol Ballroom, which will house our General Sessions, and the adjacent brand new 14,000 sq. ft. Costa De La Luna Ballroom, which will house our EXPO. Add to that, elegant Foyers, Terraces and Lawns and we have the makings for terrific, open-air social and networking events. And let’s not forget their award-winning Spa and 36 spectacular holes of golf with the Champions and Legends courses.

SWTest 2022 will be a hybrid conference, which means we will have in-person attendees at the Omni Resorts, as well as virtual attendees who are not able to travel. Because of the Covid-19 pandemic and the continuing uncertainty surrounding the Omicron variant, we will again hold a hybrid conference this year in order to include as many attendees as possible who wish to participate. Fortunately, the Omni Resort is a much larger property, so we do not anticipate we will have to limit in-person attendance.

The premiere SWTest Conference is the only industry conference that focuses on all aspects of semiconductor wafer and die level probe testing. The conference has the perfect mixture of manufacturer and vendor presentations. It is not a sales show, nor an academic or theoretical conference. It is a probe technology forum where attendees come to learn about recent developments in the industry and exchange ideas.

Following the adjournment of the Conference, SWTest 2022 will be ON-DEMAND Access 24/7 from June 9th – July 9th, 2022.

On-site Conference registration includes daily breakfasts, lunches and refreshments, cocktails & dinners, and Tuesday social activities, as well as the technical program, EXPO attendance with Scavenger Hunt, SWT Crew Mentoring Program, the eProceedings, and ON DEMAND Access.

Virtual attendance includes the technical program, an interactive EXPO with live audio/video chat, EXPO Scavenger Hunt, the eProceedings, and ON DEMAND Access.

Keynote Speakers

John Yi, - Product Engineering Organization Fellow, AMD

John is a Fellow in the Product Engineering organization at AMD and currently manages a team of architects responsible for co-developing new DFT methods & test solutions. His current focus is defining manufacturable test solutions for the challenges of AMD’s heterogenous 2.5D & 3D products. In his previous role, John was responsible for defining the architecture & test strategy for ATE, Burn-in, and System-Level test hardware across the wide spectrum of AMD products. John has been at AMD for 28+ years responsible for driving many test innovations from concept to production deployment. Prior to joining AMD, John graduated from the University of Texas in Austin in Electrical Engineering.

Architecting Test Solutions for the Next Generation of Compute

As the world of compute continues to grow from consumer devices to supercomputers to edge compute, new generation of products are being created with ever growing complexity. Future product architectures are evolving to supply the increasing demand for compute power, automation, and data. It is essential to work closely across multiple disciplines from silicon design, DFT, and test hardware/software to ensure success in being able to test these new generation of products with minimal test costs and the highest level of quality & reliability. As compute products continue to push fab process geometries in addition to pushing more complex 2.5D & 3D construction processes, this has required more emphasis on increasing test coverage & capacity for probe test solutions. Probe test requirements will demand higher current capability, tighter pitches, & higher test frequencies while sustaining high production lifetimes & test integrity. This will bring a new level of innovation in probe technologies as new metallurgy and construction schemes are being developed along with enhanced test methods across the industry. This keynote presentation will provide a general compute overview & roadmap, methods of innovating new test solutions, and provide wafer probe test needs going forward.

Rebeca Jimenez, Corporate Vice President Advanced SiP Business Unit, Amkor Technology, Inc.

Rebeca Jimenez joined Amkor in 2014 and is currently Corporate Vice President, Advanced SiP Business Unit. Prior to assuming her current role, Ms. Jimenez served in various sales and strategic program management roles. She has more than 25 years of experience in the global semiconductor industry. Prior to joining Amkor, she spent 15 years with IDT (previously ICS) in both test engineering and operations roles as well as management positions. In addition, Ms Jimenez worked in various engineering and engineering management roles at Motorola. She holds a BS in Electrical Engineering from Arizona State University, as well as an MS in Electrical Engineering from National Technological University.

Advanced Packaging and Test Enabling Our Digital Society

Semiconductors are the building blocks of our modern digital society and allow us to be connected anywhere and everywhere. We interact with semiconductors every day through almost everything we do, whether using our smartphones, personal electronics, connected homes or our cars, which have become digital cockpits, immersed with advanced safety features. All of these digital interactions require massive computing and connectivity power to process, store and transfer data.

Join me as we explore innovations in advanced packaging and test technology and how they enable further transformation in our digital society with a focus on the key catalysts of 5G, High Performance Computing, IoT and Automotive applications.



Golf tournament registration and box lunch


Tee Off for the 11th annual Sponsors & Exhibitors Golf Tournament on the Legends Course Evening – Sponsor Reception with hors d’oeuvres at the Valley Promenade

 8am – 4:30pm

Welcome from the SWTest General Chair

Keynote Speaker #1

Technical Program with 30-minute presentations in theme-oriented sessions

 5 – 8pm

SWTest EXPO showcasing the key suppliers to the semiconductor industry with cocktails and food stations

Scavenger Hunt

The virtual EXPO will take place at the same time and will feature live audio/video chat, swag giveaways and the Scavenger Hunt.

 8 – 10pm

Sponsor Hospitality Suites

 8am – 3pm

Keynote Speaker #2

Technical Program with 30-minute presentations in theme-oriented sessions

 3 – 4:30pm

SWTest EXPO showcasing the key suppliers to the semiconductor industry with refreshments

Scavenger Hunt

The virtual EXPO will take place at the same time and will feature live audio/video chat, swag giveaways and the Scavenger Hunt.

 5:30 – 9pm

Social Event with cocktails, dinner and entertainment from 5:30 – 9:00 p.m.

Winners will be announced of the golf tournament and the Expo Scavenger Hunt

 8am – 12pm

Technical Program with 30-minute presentations in theme-oriented sessions

 12 – 12:30pm

- Presentation Awards





Frequently Asked Questions

Once you have completed registration, your login details will be emailed to you ahead of the event. You can use these details to access the online event.
The event will remain open 24/7 for 30 days. Therefore, you can attend whenever it’s convenient for you during this period of time.
Yes. Like any physical event, we will have a swag bag for you! You can add all of the documents available to the online swag bag in your account and then email them to yourself.
No. You do not need to download or install any software to participate. You only need to have access to the internet.
We recommend Chrome and Firefox.